DUALSCOPE MPOR-image1
DUALSCOPE MPOR-image1

DUALSCOPE MPOR

DUALSCOPE MPOR is a portable coating thickness gauge used for non-destructive coating thickness measurement on various metal substrates. This instrument is suitable for coating inspection on steel, iron, aluminum, copper, brass, zinc, stainless steel, and other metal materials that require fast, practical, and accurate film thickness control.

In coating applications, dry film thickness is critical to ensure substrate protection, corrosion resistance, surface appearance, and compliance with technical specifications. DUALSCOPE MPOR uses two measurement methods: magnetic induction for non-magnetic coatings on ferrous substrates and eddy current for non-conductive coatings on non-ferrous metals. The system automatically recognizes the substrate material and selects the appropriate measurement method.

DUALSCOPE MPOR is designed as a pocket-size instrument with an integrated probe for one-handed operation. It provides data memory for up to 10,000 readings, statistical display such as mean value, standard deviation, minimum, maximum, and number of measurements per block, plus a USB interface for data transfer to FISCHER DataCenter software. This product is suitable for protective coatings, industrial coatings, automotive coatings, metal finishing, corrosion protection, tank inspection, and coating quality control in laboratories and field applications.

Applications Product Product Information Information Link
Dry film thickness measurement, coating thickness measurement, non-destructive coating inspection, protective coatings, industrial coatings, automotive coatings, corrosion protection, metal finishing, tank and container inspection, ferrous substrates, non-ferrous substrates, steel, iron, aluminum, copper, brass, zinc, stainless steel, magnetic induction measurement, eddy current measurement, SSPC-PA2, IMO PSPC, ASTM D7091, ISO 2178, ISO 2360, and ISO 2808 DUALSCOPE MPOR Portable coating thickness gauge for measuring coating thickness on ferrous and non-ferrous metal substrates. Uses magnetic induction and eddy current methods with automatic substrate recognition. Equipped with an integrated probe, memory for up to 10,000 readings, statistical display, USB interface, and FISCHER DataCenter software for documentation, statistical evaluation, and inspection report generation. View Information

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Catalog Number Description Quantity
3686 DUALSCOPE MPOR